EBSD data
Grain Boundary line segment data
Grain Boundary Character Distribution
Grain Boundary Distribution plots and Images
Metadata
The data provided below was collected by Sutatch Ratanaphan while at Carnegie Mellon University. The complete analysis of the data can be found in the following publication:
• S. Ratanaphan, Y. Yoon, and G.S. Rohrer, "The Five Parameter Grain Boundary Character Distribution of Polycrystalline Silicon,"Journal of Materials Science 49 (2014) 4938-4945.DOI: 10.1007/s10853-014-8195-2
The sample was cast polycrystalline silicon that is normally used for photovoltaic applications. It was obtained from MEMC (St. Peters, MO, USA). The Si was boron-doped with a concentration of 5.5 x 1016 cm-3. A wafer was cut with a wire saw and etched in potassium hydroxide solution (KOH:H2O = 1:1) to remove surface damage. This surface was suitable for electron backscatter diffraction (EBSD) analysis without further treatment.
EBSD data
Download the data to your computer. The data are in the form of .ang files. The compressed folder is 236 MB and contains 29 fields of view.
Grain Boundary line segment data
This file contains grain boundary line segments extracted from 2D data.
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Download the program used to compute the GBCD.
Grain Boundary Character Distribution
This file contains grain boundary character distribution.
Download the GBCD file to your computer
Grain Boundary Distribution plots and Images
Typical orientation map of the microstructure, colored by orientation.
The distribution of grain boundary disorientation angles.
The axis angle distribution, at the specified misorientation angles.
Grain boundary plane distributions, at specific misorientations.
Download the program used to compute the disorientation distribution, and the coordinates for the plot
Download the program used to compute and graph the axis-angle distribution
Download the program used to graph the grain boundary plane distribution at specific misorientations